RH 2010 Hall Effect Measurement System |
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SoftwareThe entire hardware is software controlled. Several I/V-modes and magnetic field modes are available for 2-point resistivity contact check and 4-point resistivity van der Pauw and Hall measurements. Data acquisition is performed automatically by measuring the differential resistance of the various contact configurations. From the I/V-curves RH and are calculated by automatic or manual linear regression. All data and results can be concisely printed out on one paper sheet as shown below.
Data and graphics can be saved in several standard formats as ASCII, DXF, EPS, HPGL, WMF, GIF, PCX and BMP. In addition to these standard results several measurement options can be selected. E.g. two independent measurement configurations for the van der Pauw and Hall measurements are possible. Also the Hall resistance (shown below) and the resistivity can be measured and evaluated as a function of the magnetic field.
Using an optional cryo system all measurements can be performed at different temperatures, providing an evaluation of the carrier concentration as a function of temperature. Load PDF-file for program structure and some key features.
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